The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2009
Filed:
Aug. 26, 2005
Cheng-shien LI, Tu-Cheng, TW;
Shou-kuo Hsu, Tu-Cheng, TW;
Cheng-Shien Li, Tu-Cheng, TW;
Shou-Kuo Hsu, Tu-Cheng, TW;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;
Abstract
The present invention provides a system and a method for analyzing jitter of various signals including measurement signals and simulation signals. The method includes the steps of: (a) obtaining a signal file; (b) identifying a type of the signal file; (c) defining a jitter analysis mode from a phase jitter mode, a periodic jitter mode and a cycle jitter mode; (d) obtaining an n-bit differential signal from the signal file; (e) rebuilding an ideal clock based on the differential signal by means of performing a Minimum Deviation Algorithm (MDA); (f) calculating and analyzing jitter of the differential signal according to the ideal clock by means of performing the MDA; and (g) generating and outputting a jitter analysis wave and jitter analysis results according to the defined jitter analysis mode.