The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2009
Filed:
Mar. 18, 2008
Naoki Fukutake, Tokyo, JP;
Naoki Fukutake, Tokyo, JP;
Nikon Corporation, Tokyo, JP;
Abstract
A microscope which has a high three-dimensional resolution, does not require specimens to be stained and is easy to operate, is presented. The three-dimensional microscope includes a first optical system for illuminating an object with lights in a plurality of illuminating directions, one direction after another; an imaging section; a second optical system for guiding diffracted lights generated by the object and reference lights to the imaging section that obtains interference images of the diffracted lights and the reference lights; and a processor for generating a three-dimensional image using the interference images for respective illuminating directions, obtained by the imaging section. The processor obtains complex amplitudes of the diffracted lights from the interference images for respective illuminating directions and generates the three-dimensional image of the object from the complex amplitudes.