The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2009
Filed:
May. 01, 2006
Andreas Hecker, Asslar, DE;
Heinrich Ulrich, Heidelberg, DE;
Werner Knebel, Kronau, DE;
Kyra Moellmann, Trippstadt, DE;
Andreas Hecker, Asslar, DE;
Heinrich Ulrich, Heidelberg, DE;
Werner Knebel, Kronau, DE;
Kyra Moellmann, Trippstadt, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
A microscope with evanescent sample illumination and a method for testing samples are disclosed. A first evanescent field, which exhibits a first penetration depth in the sample, and a second evanescent field, which exhibits a second penetration depth in the sample that is greater than the first penetration depth, are produced. A detector is provided that detects the first detection light, which exits from the part of the sample illuminated with the first evanescent field, and which produces first detection light data therefrom, and the second detection light, which exits from the part of the sample illuminated with the second evanescent field, and which produces second detection light data therefrom. Furthermore, a processing module is provided for processing the first and second detection light data.