The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2009

Filed:

Sep. 23, 2005
Applicants:

Karl Henrik Haugholt, Oslo, NO;

Svein T. Idsøe, Oslo, NO;

Anders Eikenes, Bekkestua, NO;

Inventors:

Karl Henrik Haugholt, Oslo, NO;

Svein T. Idsøe, Oslo, NO;

Anders Eikenes, Bekkestua, NO;

Assignee:

Tomra Systems ASA, Asker, NO;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device and a method for detection of characteristic features of a medium that is wholly or partly transparent, wherein said medium is placeable in an observation area in a light path extending between a light source and a light detector, wherein said medium is illuminated by the light source in the observation area, wherein at least one light-directing optical element is arranged in connection with the observation area. Light transmitted through said medium, which is deflected by said medium when it is in said area and thus causes a change of light direction in said area, is detected. Characteristics of said medium are determined by spectrometry of the received light-deflected light, and a wavelength-sensitive element is used at a position in the light path, either at or as a part of the light source or the light detector.


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