The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2009

Filed:

Jul. 31, 2006
Applicants:

Yeon Kyung Woo, Seoul, KR;

Ho Seop Jeong, Kyungki-do, KR;

Hwa Hun Chin, Seoul, KR;

Jun Ho Mun, Kyungki-do, KR;

Inventors:

Yeon Kyung Woo, Seoul, KR;

Ho Seop Jeong, Kyungki-do, KR;

Hwa Hun Chin, Seoul, KR;

Jun Ho Mun, Kyungki-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are an optical system for processing an image using a PSF and an image processing method thereof. The optical system includes one or more lenses, an image sensor, and an image processor. The image sensor senses an image formed by the lenses, and the image processor recovers the image sensed by the image sensor using a PSF. A BFL defined as a distance between a refractive surface of one of the lenses that is closest to an image-side and the image sensor, is controlled such that ΔPSF defined by Equation below has a value less than 100%. An image is recovered using a PSF, so that an excellent image can be obtained over a wide object distance range.


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