The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2009
Filed:
Dec. 31, 2006
Mark A. Sapia, Canton, CT (US);
Mark A. Sapia, Canton, CT (US);
General Electric Company, Schenectady, NY (US);
Abstract
Methods and systems for quantitative image quality assessment of an imaging system, such as an in vessel visual inspection system, having a target, an image capture device and a computer. The target includes one or more image features with varying spatial resolutions and predetermined spatial frequencies. The image capture device is configured to capture an image of the target. The computer includes a processor, a memory, and computer executable instructions. The computer is configured to receive the captured image, prepare one or more intensity profiles across the captured image responsive to the predetermined spatial frequencies, and determine a modulation transfer function responsive to the one or more intensity profiles.