The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2009
Filed:
Sep. 22, 2006
Ronald R. Hatch, Wilmington, CA (US);
Ronald R. Hatch, Wilmington, CA (US);
Navcom Technology, Inc., Torrance, CA (US);
Abstract
A new three-frequency technique for obtaining geometry free, refraction-corrected, ambiguity-resolved, carrier-phase measurements has been described. First, the ambiguities on at least two wide-lane carrier-phase measurement differences are obtained by averaging the corresponding frequency weighted code measurements. These two ambiguity-resolved measurements are then combined into a composite refraction-corrected measurement. The resulting composite measurement is quite noisy due to the amplification of the multipath noise in the original carrier-phase measurements. But this noisy refraction-corrected carrier-phase measurement can be smoothed with another minimum-noise, refraction-corrected carrier-phase composite measurement. The minimum-noise, refraction-corrected composite measurement is constructed from the primary carrier-phase measurements prior to resolving their whole-cycle ambiguities. By smoothing the difference in the two refraction-corrected measurements, the noise can be reduced and the bias in the low-noise measurement (due to incorrect ambiguities) can be estimated and subsequently corrected.