The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2009
Filed:
Apr. 24, 2008
Julian Michael Tyszka, Altadena, CA (US);
Andrey V. Demyanenko, South Pasadena, CA (US);
Yun Kee, San Marino, CA (US);
Scott E. Fraser, La Canada, CA (US);
Julian Michael Tyszka, Altadena, CA (US);
Andrey V. Demyanenko, South Pasadena, CA (US);
Yun Kee, San Marino, CA (US);
Scott E. Fraser, La Canada, CA (US);
California Institute of Technology, Pasadena, CA (US);
Abstract
A magnetic resonance (MR) microscope and a dual-mode optic and MR microscope system are disclosed. The MR microscope is provided with a horizontal stage above which a sample to be analyzed is located, a radiofrequency coil assembly located above the horizontal stage and below the sample, a magnetic field gradient module located under the horizontal stage, and a heat exchange unit thermally coupled to the magnetic field gradient module and located under the magnetic field gradient module. The dual-mode optic and MR microscope system is provided with an MR microscope and an optical microscope, the optical microscope comprising a mirror located above the sample.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile