The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2009

Filed:

May. 22, 2006
Applicants:

William Joseph Antel, Jr., Freising, DE;

Nirm Velumylum Nirmalan, Niskayuna, NY (US);

Jason Randolph Allen, Niskayuna, NY (US);

Jeffrey Lawrence Williams, Cincinnati, OH (US);

Inventors:

William Joseph Antel, Jr., Freising, DE;

Nirm Velumylum Nirmalan, Niskayuna, NY (US);

Jason Randolph Allen, Niskayuna, NY (US);

Jeffrey Lawrence Williams, Cincinnati, OH (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A thermal measurement system includes a number of detectors configured to receive radiation within respective wavelength ranges. The system also includes a mirror configured to selectively direct the radiation from an object to each of the detectors. The system further includes an actuator mechanically coupled to the mirror and configured to rotate the mirror through a number of angles. The system also includes an optical and probe subsystem disposed between the object and the mirror to focus the radiation on to the mirror.


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