The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2009

Filed:

Sep. 09, 2004
Applicants:

Brian M Wahlert, Bellevue, WA (US);

Brian T Berkowitz, Seattle, WA (US);

Catharine Van Ingen, Bellevue, WA (US);

Dharshan Rangegowda, Redmond, WA (US);

Mike Jazayeri, Kirkland, WA (US);

Inventors:

Brian M Wahlert, Bellevue, WA (US);

Brian T Berkowitz, Seattle, WA (US);

Catharine van Ingen, Bellevue, WA (US);

Dharshan Rangegowda, Redmond, WA (US);

Mike Jazayeri, Kirkland, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for detecting changes to a production location is provided. The method includes receiving a selection of a portion of the production location that is to be protected and identifying a larger portion of the production location that contains the selected portion of the production location. Upon identifying the larger portion, a routine is created for evaluating the identified larger portion of the production location for changes. That routine is performed in order to detect changes to the production location.


Find Patent Forward Citations

Loading…