The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2009

Filed:

Mar. 26, 2007
Applicants:

John E Jones, Iii, Seattle, WA (US);

Mark a Stanish, Seattle, WA (US);

Inventors:

John E Jones, III, Seattle, WA (US);

Mark A Stanish, Seattle, WA (US);

Assignee:

Weyerhaeuser NR Company, Federal Way, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods are provided for predicting warp of a wood product given its differential characteristics, such as, for example, curvature. The methods may involve measuring at least one original warp profile for each of one or more first wood products; measuring one or more inputs on the one or more first wood products; converting the warp profile, for each of the one or more first wood products, into a differential characteristic profile; developing a prediction algorithm based on the one or more inputs and the differential characteristic profile; measuring one or more inputs of the given wood product; inputting the one or more inputs of the given wood product into the prediction algorithm; and determining a differential characteristic profile for the given wood product based on the prediction algorithm.


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