The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2009
Filed:
Apr. 12, 2007
Julian Uribe, Chula Vista, CA (US);
Wei Fu, San Diego, CA (US);
Julian Uribe, Chula Vista, CA (US);
Wei Fu, San Diego, CA (US);
Applied Micro Circuits Corporation, San Diego, CA (US);
Abstract
A system and method are provided for measuring the amplitude of a received signal. The method receives an analog input signal, and compares a peak value of the analog input signal to a threshold level. Threshold transition data is generated, and the threshold level is adjusted in response to the transition data. The above-mentioned processes of comparing, generating, and adjusting are reiterated until the threshold level is about equal to the analog input signal peak value. As a result, a measurement of the analog input signal peak value is supplied. In one aspect, threshold transition data is converted into a digital value. Then, the measurement of the analog input signal peak value uses the digital value to represent the analog input signal peak value. Further, the digital value is converted into an analog voltage as feedback, and the analog voltage is used as the threshold level.