The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2009
Filed:
Jun. 03, 2004
Isao Sato, Yokohama, JP;
Hirooki Aoki, Yokohama, JP;
Masato Nakajima, Yokohama, JP;
Kazuhiro Mimura, Tokyo, JP;
Yasuhiro Takemura, Tokyo, JP;
Kei Katou, Tokyo, JP;
Toshiharu Takesue, Tokyo, JP;
Isao Sato, Yokohama, JP;
Hirooki Aoki, Yokohama, JP;
Masato Nakajima, Yokohama, JP;
Kazuhiro Mimura, Tokyo, JP;
Yasuhiro Takemura, Tokyo, JP;
Kei Katou, Tokyo, JP;
Toshiharu Takesue, Tokyo, JP;
Sumitomo Osaka Cement Co., Ltd., Tokyo, JP;
Keio University, Tokyo, JP;
Abstract
A 3-D shape measurement apparatus for grasping the state of an object with ease and accuracy is provided. The 3-D shape measurement apparatus includes: a first 3-D sensorhaving a projecting devicefor projecting a light pattern on a target area, and a (first) image capturing apparatusplaced at a first interval dfrom the projecting deviceto capture an image of the target area on which the light pattern is projected; a second 3-D sensorhaving a projecting device, and a (second) image capturing apparatusplaced at a second interval dlonger than the first interval dfrom the projecting deviceto capture an image of the target area on which the light pattern is projected; 3-D information computing meansfor obtaining external shape information on an objectbased on the shift of the pattern on the image acquired with the first 3-D sensor; variation information computing meansfor obtaining variation information on the objectbased on the shift of the pattern on the image acquired with the second 3-D sensor; and information composing meansfor composing the external shape information and the variation information.