The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2009

Filed:

Oct. 15, 2007
Applicant:

Takeo Iwasaki, Nagoya, JP;

Inventor:

Takeo Iwasaki, Nagoya, JP;

Assignee:

Brother Kogyo Kabushiki Kaisha, Nagoya-shi, Aichi-ken, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus is disclosed for measuring a three-dimensional shape of a subject, which includes: a turntable unit configured to include a turntable, and a support frame adapted to rotatably support the turntable; a measurement head configured to photograph the subject on the turntable and to measure the three-dimensional shape of the subject based on at least one resultant photograph of the subject; and a transformable holder being attached to the measurement head and holding the turntable unit. The holder is configured to be selectively placed in an unfolded position in which the turntable unit is unfolded with respect to the measurement head, and a folded position in which the turntable unit is folded with respect to the measurement head, as a result of transformation of the holder, and further configured to allow, when in the unfolded position, the subject to be located on the turntable unit and to be photographed.


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