The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2009
Filed:
Jul. 30, 2007
Robert H. Clunn, Richardson, TX (US);
Robert H. Clunn, Richardson, TX (US);
Other;
Abstract
A vector impedance measurement system () includes a first radio frequency (RF) source () for providing energy to a test circuit. A measurement device () is used for providing a first network measurement based upon the voltage and current at the terminals of the test circuit. A second RF source () is used for down converting the first network measurement to a second network measurement that is lower in frequency. The vector impedance system () operates to calculate a complex impedance using both the magnitude and phase angle of the second network measurement as determined by a processor (). In that the lower frequency at which signal processing is performed is a fixed frequency, many sensitive parameters of the band pass filters, such as gain and phase shift, can be easily calibrated and do not change during operation, resulting in a simpler calibration process and very accurate data measurements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile