The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2009

Filed:

Apr. 08, 2008
Applicants:

Georg Kinnemann, Bestensee, DE;

Svetlozar Delianski, Berlin, DE;

Andre Rompe, Berlin Kaulsdorf, DE;

Inventors:

Georg Kinnemann, Bestensee, DE;

Svetlozar Delianski, Berlin, DE;

Andre Rompe, Berlin Kaulsdorf, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/86 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for detecting overlapping flat objects, wherein each object has flat sides and narrow sides, includes a doubles detector configured to derive at least one feature of an object, a first imaging unit configured to produce an electronic image of a first flat side of the object, and a second imaging unit configured to produce an electronic image of a second flat side of the object. A determination facility of the apparatus is coupled to the first imaging unit and the second imaging unit to receive the electronic images, and to derive at least one further feature of the object. Further, a decision facility of the apparatus is coupled to the doubles detector and the determination facility to receive the least one feature and the at least one further feature of the object, and to determine whether the object is a single object or a number of objects.


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