The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2009
Filed:
May. 02, 2008
Applicant:
Juergen Dehler, Forchheim, DE;
Inventor:
Juergen Dehler, Forchheim, DE;
Assignee:
Ziehm Imaging GmbH, Nuremberg, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The subject matter of the present application relates to methods for calibrating an X-ray diagnostic system and apparatus for use in the calibration methods. In one embodiment, the apparatus includes a position detection system having an acquisition unit. An X-ray phantom is disposed near the acquisition unit in a known position and/or orientation relative to a coordinate system of the position detection system. The X-ray phantom may be detachably mounted on the acquisition unit.