The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2009
Filed:
Sep. 24, 2007
Applicant:
Hirokazu Nakamura, Nishio, JP;
Inventor:
Hirokazu Nakamura, Nishio, JP;
Assignee:
Nidek Co., Ltd., Gamagori, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
A binocular slit lamp microscope for observing a patient's eye, comprises: an objective lens; binocular eyepieces; and a mechanism that includes a plurality of optical systems and is arranged to switch the optical systems to be selectively placed in a predetermined position between the objective lens and the binocular eyepieces on an observation optical path, the mechanism including a variable magnification optical system for changing observation magnification and a viewing angle changing optical system for changing a viewing angle between a right viewing path and a left viewing path.