The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2009
Filed:
Mar. 23, 2005
Igor Dozorets, Nesher, IL;
Roy Emek, Tel Aviv-Jaffa, IL;
Sanjay Gupta, Austin, TX (US);
Itai Jaeger, Lavon, IL;
Lawrence Allyn Mcconville, Austin, TX (US);
Tzach Schechner, Tel Aviv, IL;
Todd Swanson, Round Rock, TX (US);
Igor Dozorets, Nesher, IL;
Roy Emek, Tel Aviv-Jaffa, IL;
Sanjay Gupta, Austin, TX (US);
Itai Jaeger, Lavon, IL;
Lawrence Allyn McConville, Austin, TX (US);
Tzach Schechner, Tel Aviv, IL;
Todd Swanson, Round Rock, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
The input for a test generator is a plurality of test templates, each of which typically aims at covering a specific verification task. Test templates direct the production of distinct transactions, which are the atomic functional building blocks of the design-under-verification. Test templates directed to different hardware functions of the scenario are dynamically interleaved. In this way several transactions are combined together in complex statements in order to achieve a complex test scenario. The transactions are submitted to the test generator, which generates test cases, in which the different hardware functions of the scenario are exercised in combinations. Variation among the test cases is achieved through a large number of random decisions made during the generation process.