The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2009
Filed:
Apr. 27, 2007
Murti V. Salapaka, Ames, IA (US);
Deepak Ranjan Sahoo, Horgen, CH;
Murti V. Salapaka, Ames, IA (US);
Deepak Ranjan Sahoo, Horgen, CH;
Iowa State University Research Foundation, Inc., Ames, IA (US);
Abstract
An observer based Q control method for a cantilever in an atomic force microscopy is provided that provides for a 'dual' Q behavior such that a particular effective Q is achieved when a sample is present and another effective Q when a sample is absent. In the control method, the transfer function from dither input to photo-diode output is independent of the observer so that the cantilever effectively behaves like a spring-mass-damper system. The effective quality factor and stiffness of the cantilever can be changed by appropriately choosing the state feedback gain. The method provides sample-imaging using transient atomic force microscopy.