The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2009

Filed:

Apr. 23, 2004
Applicants:

Erika Angerer, Brentford, GB;

Didier Lecerf, Brentford, GB;

Pierre Lanfranchi, Brentford, GB;

Inventors:

Erika Angerer, Brentford, GB;

Didier Lecerf, Brentford, GB;

Pierre Lanfranchi, Brentford, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/00 (2006.01); G01V 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method of processing seismic data corresponding to acquisitions carried out in a medium exhibiting azimuthal anisotropy, characterized in that for two sets of data corresponding, for one and the same seismic variable and for one and the same ground zone, to at least two different source/azimuth receiver pair sectors, an average between the data which correspond to the azimuth considered and data which correspond, for the same variable and the same ground zone, to a perpendicular azimuth sector is determined for each of the azimuths considered, and in that an estimate of the part common to the two sets thus obtained of averaged data is determined.


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