The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2009

Filed:

Nov. 04, 2003
Applicants:

Christopher William Gregory, Whitefish Bay, WI (US);

William D. Gregory, Shorewood, WI (US);

Inventors:

Christopher William Gregory, Whitefish Bay, WI (US);

William D. Gregory, Shorewood, WI (US);

Assignee:

WiSys Technology Foundation, Madison, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01);
U.S. Cl.
CPC ...
Abstract

An electrical parameter imaging apparatus and method includes the acquisition of a charge distribution pattern on an array of electrodes that surround an object being imaged. In addition the exterior boundary, or contours of the object is measured by an array of light beams and associated light sensors. The contour measurement is employed to provide a first estimate of the object geometry needed to compute an electrical parameter image from the acquired charge distribution pattern.


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Gregory, Christopher. (2009). Method and apparatus for producing an electrical property image of substantially homogeneous objects containing inhomogeneities (U.S. Patent No. 7627362). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7627362

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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