The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2009
Filed:
Jun. 30, 2005
Anis Zribi, Rexford, NY (US);
Peter Joseph Codella, Niskayuna, NY (US);
Min-yi Shih, Niskayuna, NY (US);
Ganesh Chandan Gangadharan, Bangalore, IN;
Rui Chen, Niskayuna, NY (US);
Anis Zribi, Rexford, NY (US);
Peter Joseph Codella, Niskayuna, NY (US);
Min-Yi Shih, Niskayuna, NY (US);
Ganesh Chandan Gangadharan, Bangalore, IN;
Rui Chen, Niskayuna, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method for determining analyte concentration levels is provided. The method includes acquiring radiation scattered off or transmitted by a target, analyzing at least a first portion of the radiation via a first technique to generate a first measurement of analyte concentration levels, and analyzing at least a second portion of the radiation via a second technique to generate a second measurement of analyte concentration levels. The method further determines analyte concentration levels based on at least one of the first measurement or the second measurement. In addition, a system for implementing the method and a probe for measuring and monitoring the analyte concentration levels is provided.