The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2009
Filed:
Sep. 15, 2004
Hun Seo, Yongin-si, KR;
Jin Hong Kim, Gyeonggi-do, KR;
Seung Yoon Lee, Seoul, KR;
Jin Yong Kim, Seongnam-si, KR;
Hun Seo, Yongin-si, KR;
Jin Hong Kim, Gyeonggi-do, KR;
Seung Yoon Lee, Seoul, KR;
Jin Yong Kim, Seongnam-si, KR;
LG Electronics Inc., Seoul, KR;
Abstract
An apparatus and method for testing mechanical endurance of a surface of an optical disc is disclosed, which includes a rotating plate on which the optical disc is fixed to generate scratch thereon, and rotating the fixed optical disc; and a plurality of abrasion wheels disposed in perpendicular to the rotating plate, and being in contact with the surface of the optical disc, to generate the scratch on the surface of the optical disc, wherein, the scratches generate when the optical disc rotates a predetermined turn, e.g. below ten turns for applying a predetermined load generated from the abrasion wheel on the optical disc.