The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2009
Filed:
Dec. 20, 2007
Applicants:
Hi-hyun Han, Ichon, KR;
Jee-yul Kim, Ichon, KR;
Inventors:
Hi-Hyun Han, Ichon, KR;
Jee-Yul Kim, Ichon, KR;
Assignee:
Hynix Semiconductor Inc., , KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A multi-wordline test control circuit in a semiconductor integrated device for performing a multi-wordline test in a specified cell mat among a plurality of cell mats. The multi-wordline test control circuit comprises a multi-test control block for receiving a multi-wordline test signal and outputting a first test signal and a second test signal, and a multi-wordline test block for performing the multi-wordline test in a specified cell mat among a plurality of cell mats in response to the first test signal and the second test signal.