The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2009
Filed:
Feb. 28, 2006
Naoji Moriya, Kyoto, JP;
Naoji Moriya, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
The method of the present invention generates a regularly lined electric field inside a containerretaining a sample formed by dispersing particle groups in a liquid by a voltage being applied to an electrode pairprovided in the container, generates a diffraction grating by a density distribution of the particle groups in the sample inside the container, and when acquiring a diffusion coefficient of particles from a temporal variation of intensity in a disappearing process of a diffracted light obtained by irradiating a beam of light to the diffraction grating generated by the density distribution of the particle groups, performs a particle size analysis of the particle groups by using an approximate analysis expression of a diffracted light attenuation, I(t)=∝exp[−2qDt] which uses q=2π/Λ defined by a particle concentration modulation period Λ in the density distribution diffraction grating of the particle groups, and the Einstein-Stokes relation. And if particle groups having a known particle size are dispersed in a liquid to be measured and similar measurements are performed, viscosity analysis of the liquid to be measured can be performed.