The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2009

Filed:

Jul. 27, 2006
Applicants:

Masahiro Ohishi, Tokyo, JP;

Yoshikatsu Tokuda, Tokyo, JP;

Inventors:

Masahiro Ohishi, Tokyo, JP;

Yoshikatsu Tokuda, Tokyo, JP;

Assignee:

Topcon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

To provide a surveying instrument for measuring difference in required time of light or distance to an object to be measured while covering a wide dynamic range without adjusting light amount. A light pulse emanating from a light emitting sectionis divided into a reference light cast to a reference light path Fand a measurement light cast to a measurement light path Fthrough which the measurement light travels to and is reflected back from the object to be measured. These two light beams are received with a light receiving section. With a multiplex reflection optical fiber Mpinterposed in the middle of the measurement light path F, the measurement light comes out as a row of multiplex light pulses attenuating successively in light amount at a constant rate. From this row of pulses, a measurement light of approximately the same in received light level as the reference light may be selected. Based on the selected measurement light and the reference light, the difference between the time required for the measurement light traveling through the measurement light path Fand the time required for the reference light traveling through the reference light path F, or the distance to the object to be measured, is measured.


Find Patent Forward Citations

Ohishi, Masahiro. (2009). Surveying instrument (U.S. Patent No. 7626686). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7626686

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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