The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2009

Filed:

Jun. 12, 2007
Applicants:

Jeffrey B. Boka, Lumberton, NJ (US);

Purusottam Mookerjee, Bridgewater, NJ (US);

Naresh R. Patel, Bellmawr, NJ (US);

Inventors:

Jeffrey B. Boka, Lumberton, NJ (US);

Purusottam Mookerjee, Bridgewater, NJ (US);

Naresh R. Patel, Bellmawr, NJ (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/72 (2006.01);
U.S. Cl.
CPC ...
Abstract

A target tracking method uses sensor(s) producing target signals subject to positional and/or angular bias, which are updated with sensor bias estimates to produce updated target-representative signals. Time propagation produces time-updated target states and sensor positional and angular biases. The Jacobian of the state dynamics of a target model produces the state transition matrix for extended Kalman filtering. Target state vector and bias covariances of the sensor are time propagated. The Kalman measurement residual is computed to produce state corrections, which are added to the time updated filter states to thereby produce (i) target state updates and (ii) sensor positional and angular bias updates. The covariance of a state vector comprising target states and sensor positional and angular biases is propagated, producing measurement updated state covariance including (i) target position and velocity measurement covariance updates and (ii) the sensor positional and angular bias measurement covariance updates.


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