The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2009

Filed:

May. 01, 2008
Applicants:

Thomas Cho, Fremont, CA (US);

Xiaoyue Wang, Sunnyvale, CA (US);

Inventors:

Thomas Cho, Fremont, CA (US);

Xiaoyue Wang, Sunnyvale, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 5/22 (2006.01); G06G 7/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus for properly biasing differential comparators are provided. Using a feedback relationship, a bias for a main stage that receives a first differential input of the comparator is produced. Separately, a feedback relationship produces a bias for a main stage that receives a second differential input. These biases, produced as a result of the feedback relationship between bias stages and stages that replicate the main stages, are applied to the main stages. The outputs of the differential comparator are differential outputs with improved common-mode rejection as a result of the feedback and replica biasing.


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