The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2009
Filed:
Feb. 15, 2006
Yoshiyuki Hirayama, Kokubunji, JP;
Ichiro Tamai, Odawara, JP;
Takayuki Ichihara, Tokyo, JP;
Hiroyuki Nakagawa, Yokohama, JP;
Hiroaki Nemoto, Oiso, JP;
Mineaki Kodama, Odawara, JP;
Ikuko Takekuma, Odawara, JP;
Yoshiyuki Hirayama, Kokubunji, JP;
Ichiro Tamai, Odawara, JP;
Takayuki Ichihara, Tokyo, JP;
Hiroyuki Nakagawa, Yokohama, JP;
Hiroaki Nemoto, Oiso, JP;
Mineaki Kodama, Odawara, JP;
Ikuko Takekuma, Odawara, JP;
Hitachi Global Storage Technologies Japan, Ltd., Odawara-shi, JP;
Abstract
Disclosed are a perpendicular magnetic recording medium with lower medium noise, insusceptible to thermal fluctuation and high recording resolution and a method of manufacturing it. As the step of forming a metal layer at the time of forming a recording layer on a non-magnetic substrate via a plurality of underlayers and the step of forming an oxide layer with an average thickness of 0.2 nm or less are repeated, the crystal grains are magnetically isolated without disturbing the orientation of the crystal grain of the recording layer of the perpendicular magnetic recording medium or without degrading the magnetic characteristic of the crystal grain of the recording layer.