The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2009
Filed:
Feb. 01, 2006
Yutaka Ohmori, Osaka, JP;
Michie Sakamoto, Osaka, JP;
Hisae Sugihara, Osaka, JP;
Akinori Izaki, Osaka, JP;
Yutaka Ohmori, Osaka, JP;
Michie Sakamoto, Osaka, JP;
Hisae Sugihara, Osaka, JP;
Akinori Izaki, Osaka, JP;
Nitto Denko Corporation, Ibaraki-shi, JP;
Abstract
There is provided a retardation film including a stretched film of a polymer film having an absolute value of photoelastic coefficient (m/N) of 50×10or less measured by using light of a wavelength of 550 nm at 23° C., which satisfies the following expressions (1) and (2):Re[450]<Re[550]<Re[650]  (1)Rth[550]<Re[550]  (2).In the expressions (1) and (2): Re[450], Re[550], and Re[650] respectively represent in-plane retardation values measured by using light of wavelengths of 450 nm, 550 nm, and 650 nm at 23° C.; and Rth[550] represents a thickness direction retardation value measured by using light of a wavelength of 550 nm at 23° C.