The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7624361 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 24, 2009

Filed:

Jul. 10, 2007
Applicant:

Kenichi Watanabe, Tagajo, JP;

Inventor:

Kenichi Watanabe, Tagajo, JP;

Assignee:

Freescale Semiconductor, Inc, Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and device for designing a semiconductor integrated circuit that easily reduces off leakage current. Wires connected to input terminals of a standard cell are exchanged with one another and a gate net list is changed so as to reduce off leakage current in accordance with a net probability and a current consumption table. The net probability is the probability of the state an input of the standard cell can take and is generated through an RTL function simulation and a gate level function simulation. The current consumption table is stored in a technology library storage.


Find Patent Forward Citations

Watanabe, Kenichi. (2009). Method and device for designing semiconductor integrated circuit (U.S. Patent No. 7624361). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7624361

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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