The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2009

Filed:

Aug. 04, 2005
Applicant:

Gregory A. Unruh, San Clemente, CA (US);

Inventor:

Gregory A. Unruh, San Clemente, CA (US);

Assignee:

Quantum Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Data error detection comprises storing in a first buffer data to be written to a medium and a first digital signature of the data. If the first digital signature matches a second digital signature of data read from the first buffer, a compressed form of data read from the first buffer is stored in a FIFO. If the first digital signature matches a third digital signature of an uncompressed form of the compressed data, the uncompressed form of the compressed data, a C2 ECC of a first C1 ECC of the uncompressed form of the compressed data, and one or more C1 ECCs comprising the first C1 ECC and a second C1 ECC of the C2 ECC are stored in a second buffer. Success is indicated if the one or more C1 ECCs match corresponding C1 ECCs calculated from data and C1 ECCs read from the second buffer, and if a C1 ECC of the data read from the second buffer and written to a medium matches a C1 ECC of corresponding data read back from the medium.


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