The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2009

Filed:

Sep. 29, 2005
Applicant:

Loren C. Betts, Rohnert Park, CA (US);

Inventor:

Loren C. Betts, Rohnert Park, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test system and method which employs a filter bank to select different spectral components of a pulsed measurement signal. The filter bank utilizes filter nulls to suppress non-selected spectral components. After filtering the selected spectral components, the spectral components are combined to provide for a measurement signal which is analyzed to determine characteristics of a device being tested. The characteristics of the filters can be adjusted in response to a change in the characteristics of a pulsed signal applied to the device under test, so that the selected spectral components will correspond to desired spectral components generated by the pulsed signal applied to the device under test.


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