The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7623936 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 24, 2009

Filed:

Feb. 16, 2006
Applicants:

Peng Qu, Austin, TX (US);

Vijay Devarajan, Arlington, TX (US);

Michael A. Hillis, Austin, TX (US);

Dax Middlebrooks, Kyle, TX (US);

Farzad Sadjadi, Austin, TX (US);

Chandrashekar Krishnaswamy, Austin, TX (US);

Inventors:

Peng Qu, Austin, TX (US);

Vijay Devarajan, Arlington, TX (US);

Michael A. Hillis, Austin, TX (US);

Dax Middlebrooks, Kyle, TX (US);

Farzad Sadjadi, Austin, TX (US);

Chandrashekar Krishnaswamy, Austin, TX (US);

Assignee:

Advanced Micro Devices, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for determining priority of a selected workpiece in a process flow including a plurality of operations includes providing an objective function relating manufacturing losses to workpiece priority for the operations in the process flow. The objective function is solved to generate priority metrics for at least a subset of the operations remaining for the selected workpiece to allow completion of the selected workpiece in the process flow by a target completion due time.


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