The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2009

Filed:

Apr. 13, 2006
Applicants:

Mei Chen, Palo Alto, CA (US);

Qian Lin, Palo Alto, CA (US);

Suk Hwan Lim, Palo Alto, CA (US);

Inventors:

Mei Chen, Palo Alto, CA (US);

Qian Lin, Palo Alto, CA (US);

Suk Hwan Lim, Palo Alto, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 11/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods, machines, and machine-readable media for processing multiple exposure source images, including a reference image and one or more non-reference images, are described. In one aspect, respective sets of motion vectors that establish correspondences between respective pairs of the source images are calculated. Ones of the source images are warped to a reference coordinate system based on the sets of motion vectors. For each of the non-reference ones of the warped images, a respective set of one or more measures of alignment confidence between the non-reference warped image and the reference image in the reference coordinate system is computed. Saturated pixels and unsaturated pixels are identified in the warped images. An output image with pixel value contributions from unsaturated pixels in the warped images is generated based on the computed alignment confidence measures.


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