The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2009

Filed:

Nov. 16, 2006
Applicants:

John A. Moon, Wallingford, CT (US);

Martin A. Putnam, Cheshire, CT (US);

Alan D. Kersey, South Glastonbury, CT (US);

Paul Szczepanek, Aptos, CA (US);

Inventors:

John A. Moon, Wallingford, CT (US);

Martin A. Putnam, Cheshire, CT (US);

Alan D. Kersey, South Glastonbury, CT (US);

Paul Szczepanek, Aptos, CA (US);

Assignee:

Illumina, Inc., San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical identification element for identifying an item. The optical identification element includes a binder material and one or more materials embedded in the binder material. The one or more materials provides an encoded composite X-ray diffraction pattern when illuminated by an X-ray beam. The encoded composite X-ray diffraction pattern is indicative of the item.


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Moon, John. (2009). Method and apparatus for labeling using optical identification elements characterized by x-ray diffraction (U.S. Patent No. 7623624). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7623624

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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