The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2009
Filed:
Oct. 24, 2007
Applicant:
Stephen I. Shefsky, Brooklyn, NY (US);
Inventor:
Stephen I. Shefsky, Brooklyn, NY (US);
Assignee:
Thermo Niton Analyzers LLC, Billerica, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/201 (2006.01); G01N 23/203 (2006.01);
U.S. Cl.
CPC ...
Abstract
An apparatus for inspecting objects utilizes a fan beam or flood beam to illuminate the inspected region of the object. A modulator, which may take the form of a movable mask, dynamically encodes the beam so that each segment of the inspected region receives varying amounts of radiation according to a predetermined temporal sequence. The resultant signal produced by a backscatter detector or optional transmission detector receiving radiation from the object is decoded to recover spatial information so that an image of the inspected region may be constructed.