The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2009

Filed:

Jan. 30, 2004
Applicant:

Yasuo Nakata, Hirakata, JP;

Inventor:

Yasuo Nakata, Hirakata, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/085 (2006.01);
U.S. Cl.
CPC ...
Abstract

An off-track duty measurement unit measures off-track detection sensitivity on the basis of an off-track signal, and track cross cycle information that is obtained from a tracking error signal measured by a track cross cycle measurement unit, whereby off-track detection sensitivity can be measured more accurately. Further, an off-track detection sensitivity controller changes the detection sensitivity of an off-track signal detector according to the obtained off-track detection sensitivity, whereby the off-track sensitivity can be kept constant for various kinds of discs, and accordingly, stabilities of off-track detection, track pull-in judgement, and track jumping can be secured.


Find Patent Forward Citations

Nakata, Yasuo. (2009). Method and apparatus for measuring off-track detection sensitivity (U.S. Patent No. 7623419). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7623419

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…