The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2009
Filed:
Oct. 28, 2004
Elliott A. Eklund, Penfield, NY (US);
Jeffrey J. Folkins, Rochester, NY (US);
David L. Knierim, Wilsonville, OR (US);
Elliott A. Eklund, Penfield, NY (US);
Jeffrey J. Folkins, Rochester, NY (US);
David L. Knierim, Wilsonville, OR (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
A method for testing inkjets for defects in an inkjet device includes determining, based on the likelihood that one or more inkjets are defective, whether to perform an inkjet defect test, The method may also include, identifying, if it is determined to perform an inkjet defect test, which inkjets to test based on properties of the inkjets, the number of identified inkjets being less than a total number of inkjets in the inkjet device; and testing the identified inkjets for defects using an image sensor.