The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2009
Filed:
Apr. 09, 2007
Applicants:
Daniel R. Neal, Tijeras, NM (US);
Thomas Daniel Raymond, Edgewood, NM (US);
William Shea Powers, Albuquerque, NM (US);
Inventors:
Daniel R. Neal, Tijeras, NM (US);
Thomas Daniel Raymond, Edgewood, NM (US);
William Shea Powers, Albuquerque, NM (US);
Assignee:
AMO Wavefront Sciences, LLC., Albuquerque, NM (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
A geometric measurement system is adapted to precisely measure one or more surfaces of objects such as corneas, molds, contact lenses in molds, contact lenses, or other objects in a fixture. The geometric measurement system can employ one or more of three possible methods of measurement: Shack-Hartmann wavefront sensing with wavefront stitching; phase diversity sensing; and white light interferometry.