The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2009
Filed:
Oct. 09, 2007
Nobuyuki Naka, Kyoto, JP;
Shinsuke Kashiwagi, Kyoto, JP;
Nobuyuki Naka, Kyoto, JP;
Shinsuke Kashiwagi, Kyoto, JP;
HORIBA, Ltd., Kyoto, JP;
Abstract
An object of this invention is to provide stress measurement method that is stress of the measuring object nondestructively in a short period of time. In order to attain this object, the stress measurement apparatuscomprises a correlation data storage sectionthat analyzes a correlation between reference stress related data obtained from a Raman spectrum L of an entire predetermined area Wof a reference specimen W and local stress originated data as being data obtained based on a local stress each of which applies to multiple positions WS˜WSrespectively in the predetermined area Wand stores correlation data indicating the correlation, a data obtaining sectionthat obtains measurement stress related data from a Raman spectrum L on an entire measurement area W', corresponding to the predetermined area W, of a measurement specimen WS′, and a calculation sectionthat calculates local stress originated data in the measurement area W′ based on the correlation data and the measurement stress related data.