The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2009

Filed:

Dec. 20, 2006
Applicant:

Takaaki Terashi, Saitama, JP;

Inventor:

Takaaki Terashi, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/54 (2006.01); G03B 27/72 (2006.01);
U.S. Cl.
CPC ...
Abstract

An exposure method for exposing a pattern of a reticle which has a patterned area that has the pattern, and a light shielding area provided around the patterned area, said exposure method includes the step of illuminating the reticle via an illumination optical system that includes a field stop, wherein a position corresponding to an edge of an aperture in the field stop is closer to the patterned area than a center of a width of the light shielding area on the reticle, the aperture defining a region for illuminating the reticle.


Find Patent Forward Citations

Terashi, Takaaki. (2009). Exposure apparatus, exposure method, device manufacturing method (U.S. Patent No. 7623219). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7623219

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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