The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2009
Filed:
May. 03, 2007
Genichiro Inoue, Osaka, JP;
Genichiro Inoue, Osaka, JP;
Panasonic Corporation, Osaka, JP;
Abstract
A test circuit according to the present invention performs a test of a first tri-state device and a second tri-state device having their outputs connected to the same node, and includes: a test output terminal; and a test unit operable to output a first logical value or a second logical value to the test output terminal according to whether the voltage of the node is higher or lower than a threshold value, and the test unit converts the intermediate potential occurring at the node into the first logical value and outputs the first logical value to the test output terminal when the first tri-state device outputs a high level signal to the node and the second tri-state device outputs a low level signal to the node.