The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2009
Filed:
Oct. 03, 2006
Applicants:
Shang Wu, Salt Lake City, UT (US);
Cynthia Furse, Salt Lake City, UT (US);
Chet Lo, Salt Lake City, UT (US);
Inventors:
Shang Wu, Salt Lake City, UT (US);
Cynthia Furse, Salt Lake City, UT (US);
Chet Lo, Salt Lake City, UT (US);
Assignee:
University of Utah Research Foundation, Salt Lake City, UT (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01);
U.S. Cl.
CPC ...
Abstract
Non-contact reflectometry for testing a signal path is described. The technique includes using capacitive coupling to inject a test signal into the signal path and extract a response signal from the signal path. Reflectometry techniques are used to determine characteristics of the signal path from the response signal. The technique is compatible with performing testing of a signal path carrying an operational signal.