The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2009

Filed:

Sep. 02, 2005
Applicant:

Scott C. Mcleod, Oro Valley, AZ (US);

Inventor:

Scott C. McLeod, Oro Valley, AZ (US);

Assignee:

Standard Microsystems Corporation, Hauppauge, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05F 1/573 (2006.01); G01K 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one set of embodiments, a circuit may be implemented to deliver accurately ratioed currents to a remotely located semiconductor device that has a substantially non-linear input-output characteristic that varies with temperature and is subject to effects of electromagnetic interference (EMI). The circuit may be configured to use common mode rejection by establishing an identical impedance at each of the two terminals of the remotely located semiconductor device, in lieu of coupling shunting capacitor(s) across the terminals, in order to reject EMI signals while performing temperature measurements using the remotely located semiconductor device. This may facilitate maintaining fast sampling times when performing temperature measurements, while providing a more effective method for handling EMI induced currents that may lead to temperature measurement errors, thereby eliminating those errors.


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