The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2009

Filed:

Sep. 13, 2005
Applicants:

Jihoon Park, Minneapolis, MN (US);

Jaekyun Moon, Minneapolis, MN (US);

Jun Lee, Yongin-si, KR;

Inventors:

Jihoon Park, Minneapolis, MN (US);

Jaekyun Moon, Minneapolis, MN (US);

Jun Lee, Yongin-si, KR;

Assignees:

Samsung Electronics Co., Ltd., Suwon-si, KR;

University of Minnesota, Minneapolis, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of detecting an occurrence of an error event in data and an apparatus for the same are provided. The method includes: preparing an error detection code wherein syndrome sequences for dominant error events are all different; generating a codeword from source data using the error detection code; detecting the occurrence of the dominant error event in the codeword by checking a syndrome computed from the codeword; and determining a type and likely error starting positions of the occurred dominant error event using the syndrome sequences correspond to the syndrome.


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