The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2009
Filed:
Jul. 18, 2007
Bosco Chun Sang Lai, Markham, CA;
Sunny Lai-ming Chang, Markham, CA;
Lawrence Wai Cheung Ho, Mississauga, CA;
Bosco Chun Sang Lai, Markham, CA;
Sunny Lai-Ming Chang, Markham, CA;
Lawrence Wai Cheung Ho, Mississauga, CA;
KingTiger Technology (Canada) Inc., Markham, Ontario, CA;
Abstract
Embodiments of an apparatus and method for high-speed testing of a device under test are described herein, where the device under test is coupled to a tester via a limited passband communication channel. A plurality of test vector patterns is generated having characteristics such that when a given test vector pattern is transmitted electrically at a transmission rate via the communication channel, the test vector pattern has a frequency content that is less than the frequency content of a high frequency test vector pattern if the high frequency test vector pattern were to be transmitted electrically at the transmission rate via the communication channel, and such that the frequency content of each test vector pattern when transmitted electrically at the transmission rate via the communication channel falls within the passband associated with the communication channel.