The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2009

Filed:

Dec. 13, 2005
Applicants:

Thomas F. Zurek, Walldorf, DE;

Stefan Dipper, Wiesloch, DE;

Stefan Unnebrink, Neckargemuend, DE;

Klaus Nagel, Heidelberg, DE;

Erich R. Marschall, Nussloch, DE;

Franz X. Faerber, Walldorf, DE;

Guenter Radestock, Karlsruhe, DE;

Christian M. Bartholomae, Oftersheim, DE;

Inventors:

Thomas F. Zurek, Walldorf, DE;

Stefan Dipper, Wiesloch, DE;

Stefan Unnebrink, Neckargemuend, DE;

Klaus Nagel, Heidelberg, DE;

Erich R. Marschall, Nussloch, DE;

Franz X. Faerber, Walldorf, DE;

Guenter Radestock, Karlsruhe, DE;

Christian M. Bartholomae, Oftersheim, DE;

Assignee:

SAP AG, Walldorf, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A first data storage schema in which a characteristic in a first dimension table is mapped by a first table and a second table can be received and a second data storage schema can be received. The first table maps the characteristic to a first object that include attributes to which time information is irrelevant to data processing activities and the second maps the characteristic to a second object that includes attributes to which time information is relevant to data processing activities. The second data storage schema includes a fact table including at least some facts drawn from the first data storage schema and a second dimension table that includes at least some characteristics drawn from at least one of the first object and the second object.


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