The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2009
Filed:
Mar. 31, 2006
Sudhir Vijendra, White Plains, NY (US);
Chao-wei Ou, Poughkeepsie, NY (US);
Sudhir Vijendra, White Plains, NY (US);
Chao-Wei Ou, Poughkeepsie, NY (US);
EMC Corporation, Hopkinton, MA (US);
Abstract
A method, apparatus and computer-program product for performing a system analysis of a system is disclosed. The system is represented as a plurality of independent model domains, wherein the model domain represents selected ones of a plurality of components and the relationships among the components and the method comprises the steps of representing, as proxies, selected ones of the plurality of components of a first domain, wherein the relationships among the components are limited to direct relationships among adjacent ones of the components, wherein the first domain representation is available to a second domain, providing events occurring in the first domain to the second domain, providing a mapping between a plurality events and a plurality of observable events occurring among the proxy components of the first domain and a plurality of observable events occurring among the components of the second domain, wherein the mapping is represented as a value associating each event with each observable event, and performing the system analysis based on the mapping of events and observable events.